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Direct Imaging of
Microscopic Conductive Pathways
Using a Modified Scanning Probe Microscope

Michael B. Heaney* and Ravi Viswanathan

Research and Development Division
Raychem Corporation

This is an abstract for a poster to be presented at the
Fifth Foresight Conference on Molecular Nanotechnology.
There will be a link from here to the full article when it is available on the web.

 

Disordered carbon-black/polymer composites form microscopic three-dimensional percolative electrical networks. These composites have widespread commercial applications. We have directly imaged the conductive network at the surface of these composites using an Electric Force Microscope. We can quantify the geometry of the conductive network to a resolution of 100 nm. This technique could be useful in the future construction of nanometer-scale electronic circuits.

References
[1] Phys. Rev. Lett. 75, 4433 (1995); 76, 3661(E) (1996).


*Corresponding Address:
Michael B. Heaney, Raychem Corporation MS 123-6343, 300 Constitution Drive, Menlo Park, CA 94025-1164. phone:650-361-2484, fax: 650-361-6405, E-mail: mheaney@raychem.com



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