Direct Imaging of
Microscopic Conductive Pathways
Using a Modified Scanning Probe Microscope
Michael B. Heaney* and Ravi Viswanathan
Research and Development Division
This is an abstract
for a poster to be presented at the
Foresight Conference on Molecular Nanotechnology.
There will be a link from here to the full article when it is
available on the web.
Disordered carbon-black/polymer composites form microscopic
three-dimensional percolative electrical networks. These
composites have widespread commercial applications. We have
directly imaged the conductive network at the surface of these
composites using an Electric Force Microscope. We can quantify
the geometry of the conductive network to a resolution of 100 nm.
This technique could be useful in the future construction of
nanometer-scale electronic circuits.
 Phys. Rev. Lett. 75, 4433 (1995); 76, 3661(E) (1996).
Michael B. Heaney, Raychem Corporation MS 123-6343, 300
Constitution Drive, Menlo Park, CA 94025-1164.
phone:650-361-2484, fax: 650-361-6405, E-mail: email@example.com