Scanning Probe Microscopy studies of ultra flat gold
surfaces for use in Chemical Force Microscopy
Carl Masens* and Jurgen Schulte
Dept. of Applied Physics, University of Technology,
This is an abstract
for a presentation given at the
Foresight Conference on Molecular Nanotechnology.
There will be a link from here to the full article when it is
available on the web.
The preparation of ultra flat gold surfaces for use in chemical force microscopy (CFM) has been studied. The surfaces were studied in terms of substrate effects by comparing mica, Si (110) wafer and glass slides. The effect of different annealing regimes was also investigated. Measurements on these surfaces were made by both atomic force microscopy (AFM) (in contact and tapping mode) and by scanning tunneling microscopy (STM). The films contain different morphologies with respect to grain size and topography. Calculations of surface roughness present values less than 2.5 nm for all surfaces studied, making the choice of the "flattest" surface difficult if based on criteria of surface roughness alone. Additionally it is shown that different acquisition parameters can produce dissimilar images that have stability and reproducibility.
Dept. of Applied Physics, Univeristy of Technology, Sydney
Broadway, Sydney, NSW 2007, Australia
Phone: 61-2-9514-2225; Fax: 61-2-9514-2219
Email: email@example.com; WebURL: http://www.phys.uts.edu.au/~carlm