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Chemical differentiation of surfaces with various scanning probe microscopies

Masamichi Fujihira*

Department of Biomolecular Engineering, Tokyo Institute of Technology,
Yokohama 226-8501 JAPAN

This is an abstract for a presentation given at the
Ninth Foresight Conference on Molecular Nanotechnology.
There will be a link from here to the full article when it is available on the web.

 

Recently, chemical force microscopy (CFM) [1] is used as a tool for chemical discrimination of surface chemical species. For CFM, friction force microscopy (FFM) [2], phase-lag imaging in tapping mode atomic force microscopy (TM-AFM) [3], and adhesive force mapping by pulsed-force-mode AFM (PFM-AFM) [4] have been used to discriminate various terminal groups of self-assembled monolayers (SAMs) using the AFM tips covered with SAMs of thiols [5] or organosilanes terminating in a variety of functional groups [6].

In this lecture, we will describe the recent experimental results of CFMs of patterned surfaces with SAMs prepared by microcontact printing [7] and the hydrophobic CH3-terminating domains embedded in the COOH terminating SAM matrix [8]. Both surfaces were observed by PFM-AFM for CFM. We will also discuss the difference in contrast mechanisms of FFM and PFM-AFM based upon the molecular dynamic simulation and the simple phenomeno-logical simulation [9-11]. Chemical differentiation by surface potentials [12,13], SNOM-AFM [14-19], and STM [20] and a mechanism of molecular imaging by contact-AFM [21,22] also will be presented.

References

  1. C. D. Frisbie, L. F. Rozsnyai, A. Noy, M. S. Wrighton, C. M. Lieber, Science 265 (1994) 2071.
  2. R. Overney, E. Meyer, J. Frommer, D. Brodweck, L. Howald, H.-J. Gueutherodt, M. Fujihira, H. Takano, Y. Gotoh, Nature 359 (1992) 133.
  3. K. Sasaki, Y. Koike, H. Azehara, H. Hokari, and M. Fujihira, Appl. Phys. A66 (1998) S1275.
  4. T. Miyatani, M. Horii, A. Rosa, M. Fujihira, O. Marti, Appl. Phys. Lett. 71 (1997) 2632
  5. M. Fujihira, Y. Okabe, Y. Tani, M. Furugori, U. Akiba, Ultramicroscopy 82 (2000) 181.
  6. T. Nakagawa, K. Ogawa, T. Kurumizawa, S. Ozaki, Jpn. J. Appl. Phys. 32 (1993) L294.
  7. M. Fujihira, M. Furugori, U. Akiba, Y. Tani, Ultramicroscopy 86 (2001) 75.
  8. Y. Okabe, U. Akiba, M. Fujihira, Appl. Surf. Sci. 157 (2000) 398.
  9. T. Ohzono, J. N. Glosli, M. Fujihira, Jpn. J. Appl. Phys. 37 (1998) 6535.
  10. T. Ohzono, J. N. Glosli, M. Fujihira, Jpn. J. Appl. Phys. 38 (1999) L675.
  11. M. Fujihira, T. Ohzono, Jpn. J. Appl. Phys. 38 (1999) 3918.
  12. M. Fujihira, Annu. Rev. Mater. Sci. 29 (1999) 353.
  13. K. Yagi, M. Fujihira, Appl. Surf. Sci. 157 (2000) 405.
  14. M. Fujihira, H. Monobe, H. Muramatsu, and T. Ataka, Chem. Lett. (1994) 657.
  15. H. Muramatsu et al. Appl. Phys. Lett. 66 (1995) 3245.
  16. M. Fujihira, H. Monobe, H. Muramatsu, and T. Ataka, Ultramicroscopy 57 (1995) 176.
  17. H. Muramatsu, N. Chiba, and M. Fujihira, Appl. Phys. Lett. 71 (1997) 2061.
  18. Y. Horiuchi, K. Yagi, T. Hosokawa, N. Yamamoto, H. Muramatsu, and M. Fujihira, J. Microscopy, 194, 467 (1999).
  19. K.-J. Kwak, T. Hosokawa, N. Yamamoto, H. Muramatsu, and M. Fujihira, J. Microscopy, 202, 413 (2001).
  20. S. Fujii, U. Akiba, and M. Fujihira, submitted for publication.
  21. T. Ohzono, M. Fujihira, Jpn. J. Appl. Phys. 39 (2000) 6029.
  22. T. Ohzono, M. Fujihira, Phys. Rev. B 62 (2000) 17054.

*Corresponding Address:
Masamichi Fujihira
Department of Biomolecular Engineering, Tokyo Institute of Technology
4259 Nagatsuta, Midori-ku, Yokohama 226-8501 JAPAN
Phone: +81-45-924-5784
Fax: +81-45-924-5817
Email: mfujihir@bio.titech.ac.jp
http://www.fujihira.bio.titech.ac.jp



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