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Scanning probe tip arrays for denser, faster, cheaper memories through nanotechnologyAmong the most useful tools for nanotechnology are various scanning probe tips for surface modification. A few years ago, the IBM Millipede project demonstrated the use of an array of silicon cantilevers as a nanotech memory device (see Millipede comes out of the lab) that operates by making and erasing nanometer-scale marks. In Technology Review, Kevin Bullis describes another approach to computer memory based upon similar arrays of atomic force probe tips. A few excerpts from “Higher-Capacity Memory“:
The Millipede array works by heating and indenting a polymer, while the Nanochip array uses voltage to write electronically. Apparently with both methods the integration of the tip arrays into a complete memory chip remains a challenge. If this challenge can be met, perhaps this type of highly parallel tip-directed surface modification will also prove useful as a path toward atomically precise manufacturing. 1 comment to Scanning probe tip arrays for denser, faster, cheaper memories through nanotechnology |
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[...] Arrays of atomic force probe tips are promising nanotech approaches to denser, faster, cheaper memories (see this post from nine months ago). James Tyrrell of nanotechweb.org (requires free registration) explores the latest progress from the IBM “millipede project” and looks at what yet needs to be done. The researchers have completed a fully functional prototypes system and demonstrated. They have further demonstrated accurate control of tip position at a scanning speed three to four orders of magnitude faster than a typical scanning probe microscope, and the ability to write more than 108 indents at a density of 1 Tb per square inch with a single tip. From “Nanoindenter passes memory test“ [...]