Robert D. Cormia of Foothill College passes along this information on a program to help professionals transition into nanotechnology:
Foothill College is starting a prototype program with NASA-ASL (NASA-Ames) to train working professionals (incumbent) and transitional workers to use FE-SEM (Field Emission SEM) and Transmission Electron Microscopy (TEM) plus exposure to Design of Experiments (DOE) in thin film deposition and nanocarbon synthesis.
I have attached the flier in hope that you might be able to promote this through the Foresight Institute. The training at NASA-ASL is funded through my NSF-ATE grant (but we do want people to consider our online course NANO53 to learn the material characterization techniques.
Robert D. Cormia, Foothill College
Learn to use FE‐SEM and TEM, and a course in Nanomaterials Characterization
NASA‐ASL MACS Lab ‐ UCSC Materials Analysis for Collaborative Science
Foothill College is partnering with NASA‐ASL (Advanced Studies Lab) to provide limited training on FE‐SEM (Field Emission Scanning Electron Microscopy) and TEM (Transmission Electron Microscopy) for qualified incumbent and transitional workers. The goal of this pilot program is to provide training for incumbent and transitional workers in materials engineering and technology firms, to enhance current job skills, or provide a path to enter these fields. Foothill will provide about 10 hours of hands on training (working in pairs) and additionally offer an online course to aid in nanomaterials characterization and understanding nanostructures.
Contact Robert Cormia CormiaRobert@foothill.edu and/or Michael Oye
Nanomaterials Characterization NANO053 fall quarter CRN 20892 Wednesday evening and hybrid (online)
Techniques for micro and nano characterization of materials, including imaging, structural and surface analysis techniques, and physical properties measurements. Surveys the physics of modern instrumentation involved in characterizing materials, and the typical approaches to analyzing a wide variety of materials and nanostructures. Materials analysis approaches to quality assurance and quality control, failure analysis, and problem solving. Hands‐on exercises and experiential learning will include use of the Scanning Electron Microscope (SEM), Atomic Force Microscope (AFM), Auger Electron Spectroscopy (AES), X‐Ray Photoelectron Spectroscopy (XPS), and Raman spectroscopy. In fall 2012 we will also provide a hands‐on introduction to FE‐SEM and TEM (TBA) as well as AFM/SEM sessions Wednesday afternoon and Saturday morning at Foothill College.
Contact Robert D. Cormia, CormiaRobert@foothill.edu
Register at www.foothill.edu NANO‐053.01 CRN 20892