Universal Probe
M.A. Ananyan, P.N. Louskinovich, V.D. Frolov
International conversion Foundation
Institute
for Nanotechnologies
This is an abstract
for a poster to be presented at the
Fifth
Foresight Conference on Molecular Nanotechnology.
There will be a link from here to the full article when it is
available on the web.
A new type of a probe for measuring the parameters of surfaces
of different materials from conductors to dielectrics is being
investigated. The main feature of the design of the probe
consists in the arrangement of two conductors on dielectric top.
The ends of the conductors converge in nanometer size area. This
area may be a quantum wire, quantum dot or tunnel-transparent
dielectric. Due to non-locality the distribution of electron wave
function depends on the properties of environment. In Shr�dinger
equation these properties are described as the member connected
with energy potential. All physical effects - fields, materials
that change the size of energy potential influence the space
distribution of wave function.
The change of parameters of wave function influences the
probability of the passage of electrons and by that the quantity
of tunnel current. Therefore the approach of not only conducting
materials but dielectrics also to the given area changes the
quantity of proceeding current and volt-ampere characteristic of
the given area. The measurements of these data might present the
basis for the creation of the devices that measure profile,
tunnel-spectroscopy characteristics of surfaces, distribution of
electric charges.
The probe might be produced by a combination of silicon
micromechanics technologies, ionic etching and local etching or
deposition of conducting material under the tip of scanning
tunnelling microscope. The resolution of the probes of such a
type can reach units of nanometers. The distance to a substrate
on which the probe is kept can reach several nanometers. The
results of calculations of resolution and sensitivity of probes
are adduced. The results of experimental researches are
described. These probes may be used as local activators creating
strong electric fields, electron flows of high density, plasmons,
phonons for stimulation of nanotechnology processes on substrates
of various types including dielectrics.
*Corresponding Address:
38 B. Tatarskaya Str, Moscow 113184, Russia, ph: (095) 233-53-94,
fax:(095) 233-53-82 (no name provided; abstract submitted via
email: Sergei Arseniev, [email protected])
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